Research Article

The Effect of Mg Dopant and Oxygen Partial Pressure on Microstructure and Phase Transformation of Z n T i O 𝟑 Thin Films

Figure 5

The film thickness of the zinc titanate deposited at 400°C of substrate temperature and then annealed at 800°C with different Ar to O2 ratio (a) 10 : 0, (b) 9 : 1, and (c) 8 : 2.
539657.fig.005a
(a)
539657.fig.005b
(b)
539657.fig.005c
(c)