Table 1: Characteristics of ZnO nanostructured thin film from XRD analysis, grown on different Si substrate.

Type of surfaceBare Si (Si)Gold-seeded Si (Si/Au)ZnO nanorods on gold-seeded Si (Si/Au/ZnO)

Substrate temperature (°C)Lattice constant (Å) and 𝑐 / 𝑎 ratioCrystallite size (nm) and % strainLattice constant (Å) and 𝑐 / 𝑎 ratioCrystallite size (nm) and % strainLattice constant (Å) and 𝑐 / 𝑎 ratioCrystallite size (nm) and % strain

200 𝑎 = 3 . 2 4 4 20.6
0.109
𝑎 = 3 . 2 4 6 7.6
0
𝑎 = 3 . 2 4 6 32.2
0.257
𝑐 = 5 . 1 9 9 𝑐 = 5 . 1 9 6 𝑐 = 5 . 1 0 3
𝑐 / 𝑎 = 1 . 6 0 3 𝑐 / 𝑎 = 1 . 6 0 1 𝑐 / 𝑎 = 1 . 5 7 2
300 𝑎 = 3 . 2 4 2 29.3
0.300
𝑎 = 3 . 2 4 3 11.6
0
𝑎 = 3 . 2 4 6 32.9
0.069
𝑐 = 5 . 1 9 6 𝑐 = 5 . 1 9 5 𝑐 = 5 . 1 9 3
𝑐 / 𝑎 = 1 . 6 0 3 𝑐 / 𝑎 = 1 . 6 0 2 𝑐 / 𝑎 = 1 . 6 0 0
400 𝑎 = 3 . 2 4 5 43.0
0
𝑎 = 3 . 4 4 4 19.3
0
𝑎 = 3 . 2 4 7 6.34
0
𝑐 = 5 . 2 0 2 𝑐 = 5 . 5 1 7 𝑐 = 5 . 2 0 2
𝑐 / 𝑎 = 1 . 6 0 3 𝑐 / 𝑎 = 1 . 6 0 1 𝑐 / 𝑎 = 1 . 6 0 2