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Journal of Nanomaterials
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2012
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Article
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Tab 2
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Research Article
On the Origin of Light Emission in Silicon Rich Oxide Obtained by Low-Pressure Chemical Vapor Deposition
Table 2
Concentration of oxidation states for the SRO samples according to the random bonding model.
Oxidation state
R
o
=
3
0
𝑅
=
2
0
𝑅
=
1
0
SiO
2
%
47.35
42.89
45.86
Si
2
O
3
%
23.04
29.39
19.42
SiO %
19.57
18.23
13.02
Si
2
O %
7.94
6.65
10.53
Elemental Si %
2.10
2.84
11.18