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Journal of Nanomaterials
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Journal of Nanomaterials
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2013
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Article
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Fig 14
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Review Article
Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM
Figure 14
(a) Schematic cross section of PCM cell [
21
]; (b) schematic of set/reset/read pulse shapes of typical PCM [
21
].
(a)
(b)