Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM

<table>(a) Schematic cross section of silicon nanocrystal NVM; (b) band diagram during charge injection through program operation; (c) band diagram during charge retention; (d) band diagram during charge removal through erase operation [<a href="/journals/jnm/2013/195325/#B72">38</a>, <a href="/journals/jnm/2013/195325/#B73">39</a>].</table>

Journal of Nanomaterials

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Figure 9

Figure 9: Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM 