Research Article

The Effect of Thermal Annealing Processes on Structural and Photoluminescence of Zinc Oxide Thin Film

Figure 5

SEM cross section morphologies of ZnO thin film annealing under different temperatures: (a) 300°C, (b) 400°C, (c) 500°C, and (d) 600°C.
424953.fig.005a
(a)
424953.fig.005b
(b)
424953.fig.005c
(c)
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(d)