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Journal of Nanomaterials
Volume 2013, Article ID 561534, 7 pages
Research Article

Influence of TiO2 Nanoparticles on Enhancement of Optoelectronic Properties of PFO-Based Light Emitting Diode

1School of Applied Physics, Faculty of Science and Technology, Universiti Kebangsaan Malaysia (UKM), 43600 Bangi, Selangor, Malaysia
2Department of Physics, Faculty of Science, Sana’a University, Sana’a, Yemen
3Institute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), 43600 Bangi, Selangor, Malaysia

Received 4 July 2013; Revised 25 September 2013; Accepted 25 September 2013

Academic Editor: Yanbao Zhao

Copyright © 2013 Bandar Ali Al-Asbahi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Improvement on optoelectronic properties of poly (9,9′-di-n-octylfluorenyl-2.7-diyl)- (PFO-) based light emitting diode upon incorporation of TiO2 nanoparticles (NPs) is demonstrated. The PFO/TiO2 nanocomposites with different weight ratios between 5 and 35 wt.% were prepared using solution blending method before they were spin coated onto Indium Tin Oxide substrate. Then a thin Al layer was deposited onto the nanocomposite layer to act as top electrode. The nanocomposites were tested as emissive layer in organic light emitting diodes (OLEDs). The TiO2 NPs played the most crucial role in facilitating charge transport and electrical injection and thus improved device performance in terms of turn-on voltage, electroluminescence spectra (EL), luminance, and luminance efficiency. The best composition was OLED with 5 wt.% TiO2 NPs content having moderate surface roughness and well distribution of NPs. The device performance was reduced at higher TiO2 NPs content due to higher surface roughness and agglomeration of TiO2 NPs. This work demonstrated the importance of optimum TiO2 NPs content with uniform distribution and controlled surface roughness of the emissive layer for better device performance.