Electrical Resistivity of Pristine and Functional Single-Wall Carbon Nanotubes

Table 2

Resistance of SWNTs with and without an applied electric field.

Coating sample	Agilent 34401 DMM	Keithley 2002 DMM	Comments
Unpurified pristine SWNT	256 KΩ	270 KΩ
Unpurified pristine SWNT*	29.9 Ω	29.9 Ω	Applied 3 V
Fluorinated SWNT	41.2 KΩ	40.5 KΩ
Fluorinated SWNT*	39.1 KΩ	39.2 KΩ	Applied 3 V
COOH SWNT(S3)	12.0 Ω	12.0 Ω
COOH SWNT(S3)*	16.1 Ω	16.2 Ω	Applied 3 V
COOH SWNT(S4)	18.5 Ω	18.2 Ω
COOH SWNT(S4)*	17.8 Ω	17.8 Ω	Applied 3 V
Sulfonated SWNT	5.34 KΩ	5.29 KΩ
Sulfonated SWNT*	25.6 Ω	25.7 Ω	Applied 3 V
Ni-SWNT	17.6 Ω
Ni-SWNT*	26.5 Ω		Applied 3 V
Purified pristine SWNT	21.5 Ω
Purified pristine SWNT*	34.1 Ω		Applied 3 V

*An electric field of 3 V across the fingers with a gap size of 12 mm was applied while the SWNT samples were being coated on the IDE.
Instrument used for the resistance measurement: Keithley 2002 digital multimeter and Agilent 34401 DMM.