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Journal of Nanomaterials
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Journal of Nanomaterials
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2013
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Article
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Fig 8
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Research Article
Anomalous Threshold Voltage Variability of Nitride Based Charge Storage Nonvolatile Memory Devices
Figure 8
Arrhenius plots for samples of each technology node, that is, (a) 110 nm, (b) 90 nm, (c) 65 nm.
(a)
110 nm LCT NVM
(b)
90 nm LCT NVM
(c)
65 nm LCT NVM