Research Article

Z-Contrast STEM Imaging of Long-Range Ordered Structures in Epitaxially Grown CoPt Nanoparticles

Figure 2

(a) A structure model (truncated octahedron) and a simulated HAADF-STEM image. The beam incidence is . (b) Intensity profiles of simulated images measured in the (b1) and directions (b2).
679638.fig.002a
(a)
679638.fig.002b
(b)