Effect of Mechanical Deformation on Thermoelectric Properties of p-Type Alloys
Figure 2
X-ray diffraction patterns of (Bi0.225Sb0.775)2Te3 versus annealing time at 573 K for (a) 2 times cold-pressed, and (b) 10 times cold-pressed samples. Solid dots represent the position of peak heights from standard powder pattern (JCPDS # 72-1836). Inset in (b) indicates magnified (0015) diffraction peaks of the samples.
