All-Solution-Processed InGaO3(ZnO)m Thin Films with Layered Structure
Figure 5
(a) Cross-sectional bright-field TEM image, (b) selective area diffraction pattern (SADP) and (c) HRTEM image obtained from InGaO3 thin film on ZnO buffer layer with strong c-axis preferred orientation. (d) Frequent phonon scattering at the surface of nano-grains as well as the interfaces of the InGaO3 superlattice.
