Agglomeration and Dendritic Growth of Cu/Ti/Si Thin Film

<table>Multifractal spectra <svg height="16.6625" id="M57" style="vertical-align:-2.34499pt" version="1.1" viewbox="0 0 59.650002 16.6625" width="59.650002" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
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</svg> of 90 nmCu/20 nmTi/Si annealed at temperature from 500°C to 800°C.</table>

Journal of Nanomaterials

Agglomeration and Dendritic Growth of Cu/Ti/Si Thin Film

Figure 8