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Journal of Nanomaterials
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Journal of Nanomaterials
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2014
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Article
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Fig 10
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Research Article
Optical Characterization of Silver Nanorod Thin Films Grown Using Oblique Angle Deposition
Figure 10
DOLP measurement for Si substrate (a), sample grown at 300 K (b), and sample grown at 100 K (c).
(a)
(b)
(c)