Optical Characterization of Silver Nanorod Thin Films Grown Using Oblique Angle Deposition
Figure 5
Measured (a) and values (b). Sample grown at 300 K is shown on top, while the sample grown at 100 K is shown in the middle. corresponds with the direction of the nanorods, is the perpendicular of lying in the plane of the sample, and is the perpendicular to the two previous vectors. The and values extracted for the Si substrate and Ag deposition are shown at the bottom.
