Research Article
Optical Characterization of Silver Nanorod Thin Films Grown Using Oblique Angle Deposition
Table 1
Modeling parameters and measurements for both sample grown at 300 K and sample grown at 100 K.
| | | 300 K sample | 100 K sample | | Model parameter | SEM measurement | Model parameter | SEM measurement |
| | Layer depth (nm) | 135 nm | 128 nm–160 nm | 115 nm | 110 nm–120 nm | | Nanorod angle (deg.) | 84° | 68°–72° | 84° | 68°–72° |
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