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Journal of Nanomaterials
Volume 2015, Article ID 198126, 6 pages
http://dx.doi.org/10.1155/2015/198126
Research Article

Graphene and Other 2D Material Components Dynamic Characterization and Nanofabrication at Atomic Scale

Shanghai Key Laboratory of Multidimensional Information Processing, Department of Electrical Engineering, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China

Received 18 October 2014; Accepted 30 December 2014

Academic Editor: Ching-Yuan Su

Copyright © 2015 Wei Wang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

We demonstrate how abreaction corrected transmission electron microscopy (TEM) analysis techniques that are commonly used in nanostructure characterization can be used to study the morphology of graphene and other 2D materials at atomic scale, even subangstrom scale, and evolution of nanostructure and from which we determine the graphene components nanofabrication process. The key contributions of this work are perhaps focused on two areas: (1) recent progress on graphene characterization from the TEM aspect and (2) how the electron beam can be used to fabricate nanoribbon from graphene or similar 2D material.