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Journal of Nanomaterials
Volume 2015, Article ID 276790, 7 pages
http://dx.doi.org/10.1155/2015/276790
Research Article

Study of Synchrotron Radiation Near-Edge X-Ray Absorption Fine-Structure of Amorphous Hydrogenated Carbon Films at Various Thicknesses

1Graduate School of Engineering, Nagaoka University of Technology, 16031-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
2Synchrotron Light Research Institute (Public Organization), 111 University Avenue, Muang District, Nakhon Ratchasima 30000, Thailand
3Extreme Energy-Density Research Institute, Nagaoka University of Technology, 16031-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
4Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamigori-cho, Ako-gun, Hyogo 678-1205, Japan

Received 9 September 2015; Revised 8 December 2015; Accepted 9 December 2015

Academic Editor: Hongbin Bei

Copyright © 2015 Sarayut Tunmee et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sarayut Tunmee, Ratchadaporn Supruangnet, Hideki Nakajima, et al., “Study of Synchrotron Radiation Near-Edge X-Ray Absorption Fine-Structure of Amorphous Hydrogenated Carbon Films at Various Thicknesses,” Journal of Nanomaterials, vol. 2015, Article ID 276790, 7 pages, 2015. https://doi.org/10.1155/2015/276790.