Focused Ion Beam Assisted Interface Detection for Fabricating Functional Plasmonic Nanostructures

<table class="table-group" id="tab3"><tr><td><table class="table"><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr class="thead"><td align="left" rowspan="2">Ion flux (ions cm<sup>−2</sup> s<sup>−1</sup>)</td><td align="center" colspan="2">Material-dependent current signal ratio</td></tr><tr class="thead"><td align="center">Oxide/film</td><td align="center">Substrate/film</td></tr><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr><td align="left">8.32 × 10<sup>14</sup></td><td align="center">1.09</td><td align="center">0.43</td></tr><tr><td align="left">3.12 × 10<sup>15</sup></td><td align="center">1.09</td><td align="center">0.40</td></tr><tr class="table-tr"><td colspan="3"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Material-dependent current ratios detected for the same sample.

Journal of Nanomaterials

tab3

Table 3

Table 3: Focused Ion Beam Assisted Interface Detection for Fabricating Functional Plasmonic Nanostructures 