Journal of Nanomaterials / 2015 / Article / Fig 1

Research Article

Fabrication and Characterization of CNT-Based Smart Tips for Synchrotron Assisted STM

Figure 1

Scanning electron micrograph (SEM) images of an electrochemically etched Pt90Ir10 tip before (a) and after (b) being coated with 230 nm SiO2 by PECVD.
(a)
(b)

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