Fabrication and Characterization of CNT-Based Smart Tips for Synchrotron Assisted STM

Figure 2

SEM images of the radial cross section (top view) of a 570 nm SiO₂-Pt₉₀Ir₁₀ tip (a); during focused ion beam (FIB) fabrication using circular/donut-shape pattern (b–e), tip was placed parallel to ion beam and 52° from electron beam. About 1 μm long Pt₉₀Ir₁₀ pillar with a radius of curvature less than 100 nm was exposed after fabrication.

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(b)

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