Fabrication and Characterization of CNT-Based Smart Tips for Synchrotron Assisted STM

Figure 4

(a) Scanning electron micrographs (SEM) of a Pt₉₀Ir₁₀ tip coated with 2.7 μm SiO₂ by PECVD; (b) the radial cross section of the tip apex and zoom-in image of the area in dashed square; and (c) the sidewall cross section along the tip axis and its zoom-in image in dashed rectangle.

(a)

(b)

(c)