Journal of Nanomaterials / 2015 / Article / Fig 4

Research Article

Fabrication and Characterization of CNT-Based Smart Tips for Synchrotron Assisted STM

Figure 4

(a) Scanning electron micrographs (SEM) of a Pt90Ir10 tip coated with 2.7 μm SiO2 by PECVD; (b) the radial cross section of the tip apex and zoom-in image of the area in dashed square; and (c) the sidewall cross section along the tip axis and its zoom-in image in dashed rectangle.

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