Ge Nanoislands Grown by Radio Frequency Magnetron Sputtering: Comprehensive Investigation of Surface Morphology and Optical Properties

Figure 14

3D AFM images of samples A (a), A₃₀ (b), A₉₀ (c), and A₁₂₀ (d). The inset shows the line scan profile.

(a)

(b)

(c)

(d)