Research Article
Ge Nanoislands Grown by Radio Frequency Magnetron Sputtering: Comprehensive Investigation of Surface Morphology and Optical Properties
Figure 5
3D AFM images of samples F5 (a), F10 (b), F12.5 (c), R50 (d), R150 (e), and R250 (f). The inset shows the width distribution and line scan profile.
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