Research Article

Ge Nanoislands Grown by Radio Frequency Magnetron Sputtering: Comprehensive Investigation of Surface Morphology and Optical Properties

Table 1

Process conditions for depositing Ge nanoislands.

Sample nameGrowth parameters
Substrate temperature
(°C)
Deposition time
(sec)
Ar flow rate
(sccm)
rF power
(W)
Working
pressure
(torr)
Annealing temperature
(°C)
Annealing time
(sec)

SR.TR.T300101002 × 10−3
S200200300101002.5 × 10−3
S300300300101002 × 10−3
S400400300101003 × 10−3
D300400300101003 × 10−3
D420400420101006.5 × 10−3
D540400540101005.5 × 10−3
D660400660101006 × 10−3
F540030051002.5 × 10−3
F10400300101003 × 10−3
F12.540030012.51005 × 10−3
R5040030010503 × 10−3
R150400300101503.5 × 10−3
R250400300102503 × 10−3
H400300101003 × 10−3
H300400300101003.5 × 10−3300120
H450400300101004 × 10−3450120
H650400300101005.5 × 10−3650120
A400300101003 × 10−3
A30400300101003.5 × 10−365030
A90400300101005 × 10−365090
A120400300101004.5 × 10−3650120