Research Article

Ferroelectricity, Piezoelectricity, and Dielectricity of 0.06PMnN-0.94PZT(45/55) Thin Film on Silicon Substrate

Table 1

The conditions of sputtering.

Target PMnN + PZT(45/55), PZT(45/55)
SubstrateSRO/Pt/Ti/Si(100)
GasO2 : Ar = 1 : 20
Growth temperature600°C
Pressure1 Pa
Power80 W
Thickness0.30 μm
Postheat treatmentQuenching