Research Article
Ferroelectricity, Piezoelectricity, and Dielectricity of 0.06PMnN-0.94PZT(45/55) Thin Film on Silicon Substrate
Table 1
The conditions of sputtering.
| Target | PMnN + PZT(45/55), PZT(45/55) | Substrate | SRO/Pt/Ti/Si(100) | Gas | O2 : Ar = 1 : 20 | Growth temperature | 600°C | Pressure | 1 Pa | Power | 80 W | Thickness | 0.30 μm | Postheat treatment | Quenching |
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