Surface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force Microscopy

Figure 8

(a) The 2D and 3D surface topographs of a bare SiNW-FET device are shown. Figures reprinted with permission from [32], © 2011 IOP Publishing Ltd. (b) Two-dimensional voltage drop image of the FGS at an external bias of +2 V. Figures reprinted with permission from [33], © 2011 ACS.

(a)

(b)