The Luminescent Properties and Atomic Structures of As-Grown and Annealed Nanostructured Silicon Rich Oxide Thin Films

Table 2

Calculated optical properties for structures type Si₁₄O₁₄:.

Reference	Structure	Wavelength with the highest intensity emission (nm) in UV-Vis spectrum	Frequency peak with the highest intensity cm^−1 (due to Si-O bonds) in FTIR spectrum	Frequency due to Si-H bonds cm^−1 (only peaks with the highest intensities in FTIR spectrum are shown)
Figure 3	Si14O14:H12	268.7	934	2306
Figure 4	Si14O14:H10	292.5	925	2300
Figure 5	Si14O14:H8	303–306.2	926	2264 and 2306
Figure 6	Si14O14:H6	314.1	922	2302
Figure 7	Si14O14:H4	317.9	925	2271 and 2309
Figure 8	Si14O14	444.4	996	It does not exist