Nanocrystals Growth Control during Laser Annealing of Sn:(α-Si) Composites

Figure 2

SEM images of the 3-layer structure Si/Sn/Si (region A in Figure 1). The thicknesses of the deposited layers were  :  :  = 100 : 50 : 100 nm. Panels (a) and (b) are images of the surface with different magnification. Panels (c) and (d) are tilted images of the chipped surface.

(a)

(b)

(c)

(d)