Journal of Nanomaterials / 2016 / Article / Fig 1

Research Article

Characterization of Class F Fly Ash Using STXM: Identifying Intraparticle Heterogeneity at Nanometer Scale

Figure 1

STXM images of Class F fly ash for Al K-edge taken at (a) 1550 eV; (b) 1570 eV; (c) image map of samples by taking a contrast between (a) and (b); (d) image map of the smaller area shown as a white rectangular region in (c) for spectral analysis.

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