Characterization of Class F Fly Ash Using STXM: Identifying Intraparticle Heterogeneity at Nanometer Scale

Figure 1

STXM images of Class F fly ash for Al K-edge taken at (a) 1550 eV; (b) 1570 eV; (c) image map of samples by taking a contrast between (a) and (b); (d) image map of the smaller area shown as a white rectangular region in (c) for spectral analysis.