Journal of Nanomaterials / 2016 / Article / Fig 2

Research Article

Characterization of Class F Fly Ash Using STXM: Identifying Intraparticle Heterogeneity at Nanometer Scale

Figure 2

(a) STXM image map of Class F fly ash for Al K-edge. Numbers indicate the corresponding spectra from which the NEXAFS Al K-edge spectra are taken within the dotted enclosed region; (b) NEXAFS Al K-edge spectra of sample; (c) NEXAFS Al K-edge spectra of reference compounds.

We are committed to sharing findings related to COVID-19 as quickly as possible. We will be providing unlimited waivers of publication charges for accepted research articles as well as case reports and case series related to COVID-19. Review articles are excluded from this waiver policy. Sign up here as a reviewer to help fast-track new submissions.