Journal of Nanomaterials / 2016 / Article / Fig 2

Research Article

Characterization of Class F Fly Ash Using STXM: Identifying Intraparticle Heterogeneity at Nanometer Scale

Figure 2

(a) STXM image map of Class F fly ash for Al K-edge. Numbers indicate the corresponding spectra from which the NEXAFS Al K-edge spectra are taken within the dotted enclosed region; (b) NEXAFS Al K-edge spectra of sample; (c) NEXAFS Al K-edge spectra of reference compounds.
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