Journal of Nanomaterials / 2016 / Article / Fig 3

Research Article

Characterization of Class F Fly Ash Using STXM: Identifying Intraparticle Heterogeneity at Nanometer Scale

Figure 3

STXM image map of Class F fly ash at (a) Fe -edge; (b) Si K-edge. NEXAFS spectra of sample taken from various regions as shown in the image map for (c) Fe -edge; (d) Si K-edge.
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