Physical Properties Investigation of Reduced Graphene Oxide Thin Films Prepared by Material Inkjet Printing

Table 1

Thicknesses of the prepared samples determined by spectroscopic ellipsometry (SE), profilometry, and atomic force microscopy (AFM).

Material	Thickness SE [nm]	Thickness profilometer [nm]	Thickness AFM [nm]
Graphene oxide
Chemical reduction of GO
Thermal reduction of GO
UV reduction of GO