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Journal of Nanomaterials
Volume 2017, Article ID 4308294, 8 pages
https://doi.org/10.1155/2017/4308294
Research Article

Stoichiometry Calculation in BaxSr1−xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling

1COARA, Universidad Autónoma de San Luis Potosí, Carretera a Cedral Km 5+600, 78700 Matehuala, SLP, Mexico
2Instituto Politécnico Nacional, Laboratorio de Materiales Funcionales, CICATA Legaria, Legaria 694, Col. Irrigación, 11500 Ciudad de México, Mexico
3Universidad de Guanajuato, Campus Irapuato-Salamanca, Ex-Hacienda el Copal, Km. 9, Irapuato-Silao AP311, 36500 Irapuato, GTO, Mexico
4Instituto de Ingeniería y Tecnología, Departamento de Física y Matemáticas, Universidad Autónoma de Ciudad Juárez, Ciudad Juárez, CHIH, Mexico
5Departamento de Física, CINVESTAV-IPN, Av. Instituto Politécnico Nacional 2508, Gustavo A. Madero, San Pedro Zacatenco, 07360 Ciudad de México, Mexico
6Instituto Politécnico Nacional, Materiales y Tecnologías para Energía, Salud y Medioambiente (GESMAT), CICATA Altamira, Km 14.5, Carretera Tampico-Puerto Industrial Altamira, 89600 Altamira, TAMPS, Mexico

Correspondence should be addressed to J. L. Fernández-Muñoz; xm.npi@zednanreflj

Received 3 April 2017; Revised 23 May 2017; Accepted 30 May 2017; Published 9 August 2017

Academic Editor: Philip D. Rack

Copyright © 2017 J. Reséndiz-Muñoz et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

J. Reséndiz-Muñoz, J. L. Fernández-Muñoz, M. A. Corona-Rivera, et al., “Stoichiometry Calculation in BaxSr1−xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling,” Journal of Nanomaterials, vol. 2017, Article ID 4308294, 8 pages, 2017. https://doi.org/10.1155/2017/4308294.