Research Article
Stoichiometry Calculation in BaxSr1−xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling
Figure 2
X-ray diffractograms for samples B120S0–B0S120. Peaks marked with “” correspond to the orthorhombic Ba1.91Sr0.09TiO4 and those with “” to the tetragonal phase of BST-SS. Unmarked peaks correspond to the cubic phase.