Effect of Precursor Concentration on Structural Optical and Electrical Properties of NiO Thin Films Prepared by Spray Pyrolysis

Table 1

Values of Bragg angle , lattice constants , full width at half maximum , grain size , mean strain , and dislocation density deduced from the (111) peak of NiO thin films prepared at 500°C with different of precursor concentration.

Precursor concentration	(deg)	Lattice constants (Å)	(deg)	(nm)	(%)	(lines /m^2)
0.015 M	—	—	—	—	—	—
0.03 M	37.396	4.160	0.576	15.207		4.323
0.04 M	37.377	4.163	0.432	20.275		2.432
0.05 M	37.496	4.153	0.472	18.552		2.905
0.1 M	37.392	4.165	0.236	37.085		7.271