Research Article
Advanced In Situ I-V Measurements Used in the Study of Porous Structures Growth on Silicon
Figure 2
SEM images of the samples anodized at different current densities in 360 min at 0.5 mA/cm2 (a), 1 mA/cm2 (b), and 2 mA/cm2 (c).
(a) |
(b) |
(c) |