Topological Transition in a 3 nm Thick Al Film Grown by Molecular Beam Epitaxy

Figure 1

(a) AFM image of the top surface of the 3 nm thick aluminum film. Note that the scale bar ranges from -1.0 nm to 1.0 nm. (b) Cross-sectional TEM image of the as-grown 3 nm thick Al film grown by MBE.

(a)

(b)