Research Article

Structural Evolution and Photoluminescence of SiO2 Layers with Sn Nanoclusters Formed by Ion Implantation

Figure 6

PLE spectrum of the SiO2 (600 nm)/Si samples implanted with 200 keV Sn+ to a fluence of and annealed in an air atmosphere for 60 minutes at 900°С. The inset shows the PLE spectrum for the emission at 3.15 eV (T1 → S0) attributed to twofold coordinated Sn atoms in SiO2 from Ref. [5].