Characteristics of a Multiple-Layered Graphene Oxide Memory Thin Film Transistor with Gold Nanoparticle Embedded as Charging Elements

Figure 1

(a) TEM image of a graphene oxide (GO) sheet and the SAED pattern image (inset). (b) AFM image of graphene oxide (GO) sheets. The average height was 0.5 nm. (c). Analysis of GO Raman and XPS (top) Raman spectrum D: 1345 cm^-1 and G: 1587 cm^-1 and 2D (bottom) XPS spectrum C=C bond: 284.40 eV, C-O bond: 286.50 eV, and C=O bond 288.30 eV.

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