Research Article
Micro- and Nanostructure of Layered Si\Sn\Si Films, Formed by Vapor Deposition
Figure 13
SEM images due to “InBeam” detectors of the a‐Si (~50 nm)/Sn (~15 nm)/a‐Si (~200 nm) structure surface at different magnifications.
(a) |
(b) |
(c) |
(d) |