Micro- and Nanostructure of Layered Si\Sn\Si Films, Formed by Vapor Deposition

Figure 9

One‐dimensional distribution of surface roughness of structures a‐Si (~50 nm)/Sn (~15 nm)/a‐Si (~200 nm) (a) and a‐Si (~50 nm)/Sn (~15 nm)/a‐Si (~200 nm) (b).

(a)

(b)