Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD

<table>Normalized PLE spectra of Er<sup>3+</sup> codoped Si<sub>x</sub>O<sub>y</sub> films with different at. % of Si and Er measured at 1534 nm.</table>

Journal of Nanotechnology

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Figure 2

Figure 2: Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD 

Figure 2 | Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD 