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Journal of Nanotechnology
Volume 2010 (2010), Article ID 279608, 6 pages
http://dx.doi.org/10.1155/2010/279608
Research Article

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy

1Department of Physics, Boston College, Chestnut Hill, MA 02467, USA
2Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA

Received 3 March 2010; Revised 25 May 2010; Accepted 17 June 2010

Academic Editor: Thomas Thundat

Copyright © 2010 Yucheng Lan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Yucheng Lan, Hui Wang, Dezhi Wang, Gang Chen, and Zhifeng Ren, “Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy,” Journal of Nanotechnology, vol. 2010, Article ID 279608, 6 pages, 2010. doi:10.1155/2010/279608