Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy

<table>Mechanical stability dependence of thickness of ALD <svg height="14.8625" id="M85" style="vertical-align:-3.25793pt" version="1.1" viewbox="0 0 39.224998 14.8625" width="39.224998" xmlns="http://www.w3.org/2000/svg">
<g transform="matrix(1.25,0,0,-1.25,0,14.8625)">
<g transform="translate(72,-60.11)">
<text transform="matrix(1,0,0,-1,-71.95,63.41)">
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</text>
<text transform="matrix(1,0,0,-1,-54.57,63.41)">
<tspan style="font-size: 12.50px; " x="0" y="0">O</tspan>
</text>
<text transform="matrix(1,0,0,-1,-45.55,60.28)">
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</text>
</g>
</g>
</svg> films with data of carbon supporting films for comparison.</table>

Journal of Nanotechnology

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Figure 3

Figure 3: Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy 