Journal of Nanotechnology / 2011 / Article / Fig 5

Research Article

Hydrogenated Nanocrystalline Silicon Thin Films Prepared by Hot-Wire Method with Varied Process Pressure

Figure 5

Deconvoluted Raman spectra for a nc-Si:H film prepared at  mTorr with two Gaussian peaks and one Lorentzian peak and a quadratic base line, with an algorithm based on the Levenberg-Marquardt method [26].

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