A Review on Aerosol-Based Direct-Write and Its Applications for Microelectronics
Figure 14
Shadowgraph results showing (a) histogram of particle size, (b) particle velocity versus distance from the nozzle exit, and (c) CW laser beamwidth and number of particles from shadowgraphy versus radial position (focus), from Mahmud et al. [86], Copyright 2010 ASME. Reprinted with permission.
