Journal of Nanotechnology / 2012 / Article / Fig 3

Research Article

Flat-Top and Stacking-Fault-Free GaAs-Related Nanopillars Grown on Si Substrates

Figure 3

(a) SEM and (b)–(d) TEM images of the core-multishell GaP/GaAs/GaP nanowires. EDS mapping images are also included in (b). (a) Side view. (b)–(d) Sliced and thinned samples: (b) perpendicular to the axis; (c), and (d) along the axis.

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