Review Article

Silicon Nanofabrication by Atomic Force Microscopy-Based Mechanical Processing

Figure 22

Surface morphology and I-V characteristics of areas processed at different loads and voltages of (closed circle) 40 nN, 0 V, (closed triangle) 0 nN, 1 V, and (closed square) 40 nN, 1 V.
102404.fig.0022a
(a)
102404.fig.0022b
(b)