Assessing the Static and Dynamic Sensitivity of a Commercial Off-the-Shelf Multicore Processor for Noncritical Avionic Applications

Table 1

Independent and dependent variables for radiation tests.

Independent variables		Dependent variables
Manipulated (static and dynamic tests)	Neutron flux	Single-bit upset (SBU); Multiple-bit upset (MBU); Multiple-cell upset (MCU); Single-event functional interruption (SEFI)
	Distance DUT to target
	Exposure time
System dependent (dynamic test)	Implemented application
	Multiprocessing mode
	Programming model